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BIB

All authors

Jorge Velasquez, Felipe Castro, Davood Babazadeh, Sebastian Lehnhoff, Thomas Kumm, Daniel Heuberger, Riccardo Treydel, Tim Lueken, Steffen Garske, Lutz Hofmann

Publishing date

July / 2018

Type of Publication

proceedings

Publisher

IEEE

Organization

TU Delft, Austrian Institute of Technology (AIT), Washington State University

Doi

10.1109/MSCPES.2018.8405402

Url

http://www.palensky.org/mscpes/2018/