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All authors

Erich Barke and Andreas Fuertig and Georg Glaeser and Christoph Grimm and Lars Hedrich and Stefan Heinen and Eckhard Hennig and Hyun-Sek Lukas Lee and Wolfgang Nebel and Gregor Nitsche and Markus Olbrich and Carna Radojicic and Fabian Speicher

Booktitle

2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016

Publishing date

5 / 2016

Type of Publication

inproceedings

Publisher

IEEE

Pages

1102--1111

Projects

ANCONA
Analog-Coverage in der Nanoelektronik (sorry - only available in german)

Url

http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=7459473

Editor

Luca Fanucci and Jürgen Teich