Modelling the impact of high level leakage optimization techniques on the delay of RT-components - OFFIS

Your browser does not support JavaScript!

To use all the features of this page, you need JavaScript!<br> Please update your browser or enable JavaScript in your settings.

Home
OFFIS
Publikationen
Modelling the impact of high level leakage optimization techniques on the delay of RT-components

Modelling the impact of high level leakage optimization techniques on the delay of RT-components

Export

All authors

Hoyer, M. and Helms, D. and Nebel, W.

Booktitle

Proceedings of the PATMOS 2007

Publishing date

01 / 2007

Type of Publication

inproceedings

Projects

CLEAN
Controlling LEAkage power in NanoCMOS SoCs

OFFIS Autoren

Wolfgang Nebel

Privacy Data Transparency Contact Legals