Proof Certificates and Non-linear Arithmetic Constraints

BIB
Kupferschmid, Stefan and Becker, Bernd and Teige, Tino and Fränzle, Martin
Proceedings of the 14th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2011)
01 / 2011
inproceedings
IEEE

OFFIS Autoren