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Helms, Domenik and Eilers, Reef and Oppenheimer, Frank and Nebel, Wolfgang

Booktitle

Proceedings of the 2013 IEEE European Test Symposium

Abstract

The Catrene project RELY focusses on the characterization of recent ageing mechanisms, developing modelling concepts describing ageing at different levels of the design process and on developing high-level optimization techniques, increasing the reliability of systems, made of recent technology’s transistors. The RELY consortium consist of five major integrated device manufacturers (IDMs), application partners from the automotive, avionic and medical domain, EDA software providers as well as eight institutes and universities from Germany, France, the Netherlands and Romania.

Publishing date

5 / 2013

Type of Publication

inproceedings

Organization

LIRMM

Projects

RELY
Design for RELIABILITY of SoCs for Applications like Transportation, Medical, and Industrial Automation

Editor

Patrick Girard