Analysis of NBTI Effects on High Frequency Digital Circuits

BIB
Ahmet Unutulmaz, Domenik Helms, Reef Eilers, Malte Metzdorf, Ben Kaczer, Wolfgang Nebel
DATE
3 / 2016
inproceedings
ROBUST
Designing Robust Nanoelectric Systems
RELY
Design for RELIABILITY of SoCs for Applications like Transportation, Medical, and Industrial Automation
MoRV
Modelling reliability under variability
3Ccar
Integrated Components for Complexity Control in affordable electrified cars

OFFIS Autoren