Automated Handling and Assembly of Customizable AFM-Tips

BIB
Bartenwerfer, M. and Eichhorn, V. and Jasper, D. and Fatikow, S. and Savenko, A. and Petersen, D.~H. and Malm, B. and Bøggild, P.
Proccedings of the IEEE International Symposium on Assembly and Manufacturing (ISAM'11)
01 / 2011
inproceedings
1-6
NanoBits
Exchangeable and Customizable Scanning Probe Tips
10.1109/ISAM.2011.5942350