Abstracting TCAD models above the circuit level.

BIB
Domenik Helms, Reef Eilers, Malte Metzdorf, Wolfgang Nebel
March / 2015
misc
MoRV
Modelling reliability under variability
ISBN: 978-3-9815370-4-8
https://past.date-conference.com/proceedings-archive/2015/

OFFIS Autoren

Wolfgang Nebel
Wolfgang Nebel