Chip Design Process Optimization Based on Design Quality Assessment

BIB
Häusler, Stefan and Sebeke, Christian, Blaschke, Jana and Rosenstiel Wolfgang and Hahn, Axel
IAENG Transactions on Engineering Technologies: Volume 4: Special Edition of the World Congress on Engineering and Comuter Science 2009
07 / 2010
978-1-59904-901-4
inbook
American Institute of Physics
428 -- 442
PRODUKTIV+
Referenzsystem zur Messung der Produktivität eim Entwurf nanoelektronischer Systeme
Sio-Iong Ao

OFFIS Autoren

Axel Hahn
Axel Hahn