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Alle Autoren

Domenik Helms, Daniele Rossi, Haider Muhi Abbas, Mohd Syafiq Mispan, Shengyu Duan, Lorena Anghel, Helena-Maria Dounavi, Gaole Sai

Zusammenfassung

This book provides comprehensive coverage of the latest research into integrated circuits’ ageing, explaining the causes of this phenomenon, describing its effects on electronic systems, and providing mitigation techniques to build ageing-resilient circuits.

Erscheinungsdatum

2020

ISBN / ISSN

978-3-030-23781-3

Publikationstyp

book

Verlag

Springer

Projekte

MoRV
Modelling reliability under variability